INTERFEROMETERS

 

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SMX-QM50

SMX-QM50 is a high-end white light interferometer with high resolution and large field of view to inspect MT, MT/APC, MT-RJ connectors in a single scan.

SMX-QM50 Interferometer

Interferometer’s compact size is ideal for facilities with limited bench space. The device is portable and can operate on internal rechargeable battery for two hours.

The objective is built integrated inside the stage, which provides extreme
vibration resistance. No vibration damping table is needed and device can work in a noisy manufacturing or repair facility.

SMX-QM50 features autofocus with long range, which simplifies and speeds up the measurement procedure.

You can download PDF documents:

The SMX-QM50 interferometer is supplied with the ISI (Interferometric Surface Inspection) analytical software. Read more about software

Features

System

Measurement Technique: non-contact; optical Phase Shift Mireau Interferometry
monochrome and white light modes
Lens: 2× optical magnification, A=0.24; Mireau;
reference flatness error < λ/25
Illuminator: white LED (average λ=560 nm)
Field of View: 5.2×3.8  mm
Magnification: 150× (the digital zoom turned off)
Focus: automatic
Measurement Array: selectable, max 3000 × 2200 px
Connector Holder: holders for MT, MT/APC connectors;
custom sample holders

Measurement

Measurement range: Lateral resolution: 1.75 µm
Height resolution: 30 nm
Scanning and Calculation Time: 100 sec

Recommended Environment

Temperature: +20°C… +25°C
Pressure: 700 – 850 mm mercury
Relative Humidity: 60 – 80%

Dimensions and Weights

Dimensions (HxWxL): 110x145x240 mm
Weight: 3.6 kg

Power

Power Consumption: 12 V, 1 A maximum

System Requirements

Recommended: Windows XP Professional SP2/Vista;
Intel Core 2 Duo or equivalent with SSSE3 support, 2GB RAM or higher, 2MB of L2 cache or higher;
Built-in Intel USB 2.0 controller